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DX-28 mini

The DX-28mini Benchtop X-ray Diffractometer is a compact benchtop XRD system designed for industrial production, quality control, research laboratories, and educational institutions. It performs phase identification, quantitative phase analysis, crystallinity determination, and crystal structure analysis for a wide range of materials.

✔  Compact & space-saving design
✔  High-precision XRD analysis
✔  Stable 600 W X-ray source
✔  Wide scanning range (-3° to 156° 2θ)
✔  Accurate phase and crystal structure analysis
✔  Ideal for QC, R&D, and educational laboratories

Description

The DX-28mini Benchtop X-ray Diffractometer is a compact and versatile XRD system designed for industrial production, quality control, research laboratories, and educational institutions. Despite its small footprint, it delivers reliable and accurate material analysis, making it ideal for laboratories with limited space. The system supports a wide range of applications, including phase identification, quantitative phase analysis, crystallinity determination, and crystal structure analysis across various materials.

Equipped with a high-frequency, high-voltage 600 W X-ray generator (40 kV, 15 mA) and an advanced metal-ceramic Cu-target X-ray tube, the DX-28mini ensures stable performance and long operational life. Its precision θs–θd goniometer, driven by servo motors and optical encoder control, provides highly accurate measurements with diffraction angle linearity better than 0.02° throughout the measurement range. With a scanning range of -3° to 156° (2θ), the instrument delivers dependable and repeatable results for both routine testing and advanced research applications.

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Application features
  • Compact benchtop design requiring minimal laboratory space.
  • High-frequency, high-voltage X-ray generator (600 W, 40 kV, 15 mA) for stable and repeatable measurements.
  • Advanced metal-ceramic Cu-target X-ray tube with long service life.
  • θs–θd goniometer driven by servo motors with optical encoder control for high precision.
  • Diffraction angle linearity better than 0.02° across the measurement range.
  • Measurement range: -3° to 156° (2θ).